Description
Wafer Semiconductor Inspection Lamp SLEX-GB-H127-SFN-DN
Optical wafer inspection specially developed for quality assurance and testing of wafers also integration of the systems into existing reactors wafer surface inspection to increase ROI.
Choose a robust, low-maintenance yellow light lamp for optical wafer inspection with comprehensive process reliability thanks to extremely strong displays and enormous energy savings compared to 100 watt mercury discharge bulbs.
Why use filtered SLEX lamps from SECU-CHEK for wafer surface inspection?
The lamp ensures a high level of process reliability as well as economically efficient and trouble-free testing operations.
Furthermore, solid wafer testing is crucial for the further cost-intensive steps of wafer preparation and chip production.
Therefore, a professional, industry-standard solution is required.
What errors are in the wafer production and how well can they be detected with the SECU-CHEK yellow light lamp?
With the Slex series, almost all errors are quickly visible. Here we differentiate between inclusions, general impurities, Stunted growth, haze or streaks.
With our lamps you can easily identify microstructures, growth holes and flattened edges or edge disturbances as well as structural shifts.
